Journal of Institute of Control, Robotics and Systems (제어로봇시스템학회논문지)

Institute of Control, Robotics and Systems (제어로봇시스템학회)
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Adaptive Control of the Atomic Force Microscope of Tapping Mode: Chaotic Behavior Analysis

진동방식의 원자간력 현미경으로 표면형상 측정시 발행하는 혼돈현상의 적응제어

  • Kang, Dong-Hunn (Dept.of Intelligent Mechanical Engineering, Graduate School of Busan National University) ;
  • Hong, Keum-Shik (Mechanical Technology Research Center, Dept.of Mechanical Engineering, Busan National University)
  • 강동헌 (부산대학교 대학원 지능기계공학과) ;
  • 홍금식 (부산대학교 기계공학부 및 기계기술연구소)
  • Published : 2000.01.01
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Abstract

In this paper, a model reference adaptive control for the atomic force microscope (AFM) of tapping mode is investigated. The dynamics between the AFM system and al sample is mathematically modeled as a second order spring-mass-damper system with oscillatory inputs. The attractive and repulsive forces between the tip of the AFM system and the sample are derived using the Lennard-Jones potential energy. By non-dimensionalizing the displacement of the tip and the input frequency, the chaotic behavior near a resonance frequency is better depicted through the non-dimensionalized equations. Four nonlinear analysis techniques, a phase portrait, sensitive dependence on initial conditions, a power spectral density function, and a Pomcare map are investigated. Because the equations of motion derived in this paper involve unknown parameter values such as the damping effect of the air and the interaction constants between materials, the standard model reference adaptive control is adopted. Two control objectives, the prevention of chaos and the tracking of reference signal, are pursued. Simulation results are included.

Keywords

References

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