Economic Constant Stress Plans for Accelerated Life Testing

가속수명시험을 위한 경제적 일정스트레스 계획의 개발

This paper deals with two economic optimal designs of constant-stress accelerated life test(ALT) where failure distribution follows one of location-scale family, i. e., exponential, Weibull, and lognormal distributions which have been ones of the popular choices of failure distributions. Two optimization criteria to develop ALT plans are the statistical efficiency per unit expected cost which consists of the fixed test cost, cost being proportional to the number of test units, and variable test cost depending on test period and stress level, and the expected loss which combines Taguchi's quadratic loss function and expected test cost. Optimum plan determines the low stress level, test units allocated to each stress, and censoring times at two stress levels under Type I censoring. The proposed ALT plans are illustrated with a numerical example and sensitivity analyses are conducted to study effects of pre-estimates of design parameters.