Ceramist (세라미스트)
- Volume 2 Issue 1
- /
- Pages.41-48
- /
- 1999
- /
- 1226-976X(pISSN)
- /
- 2586-0631(eISSN)
Microstructure Analysis of Materials by Recent Transmission Electron Microscopy
최신 TEM 분석법에 의한 재료의 미세구조 해석
- Park, Gyeong-Su (Samsung Advanced Institute of Technology) ;
- Park, Min-Woo (Dept. of Materials Engineering, Kyungsung University)
- Published : 1999.02.28
Abstract
Keywords