References
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- IEEE Transactions on Reliability Optimum Simple Step-Stress Accelerated Life Tests with Censoring Bai, D. S.;Kim, M. S.;Lee, S. H.
- Microelectronics and Reliability v.19 Step-Stress Accelerated Life Testing of Diodes Bora, J. S.
- Naval Research Logistics v.31 Estimation for a Weibull Accelerated Life Testing Model Glaser, R. E.
- IEEE Transactions on Eletron Devices v.36 LIfetime of Thin Oxide and Oxide-Nitride-Oxide Dielectrics Within Trench Capacitors for DRAM's Hiergeist, P.;Spitzer A;Roehl, S.
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- IEEE Transactions on Reliability v.R-29 Accelerated Life Testing-Step Stress Models and Data Analysis Nelson, W.
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