References
- IEEE Trans. of Pattern Analysis and Machine Interlligence v.10 no.1 An automatic wafer inspection wywtem using pipelined image processing techniques H. Yoda;Y. Ohuchi;Y. Taniguchi;M. Ejiri
- IEEE Trans. on Pattern Analysis and Machnie Intelligence Automated x-ray inspection of aluminum castings H. Boerner;H. Strecker
- Internat. Conf. on Automation. Rovotics and Computer Vision Automated visual inspection of painted metallic surfaces A. Ercil
- Machine Vision for Inspection and Measurement H. Freeman
- IRCV v.1193 A machine vision system for real time inspection of moving web J. L. C. Guay
- IEEE Trans. on Industrial Electronics v.40 no.2 Web precoee inspection using neural classification of scattering lignt L. J. Olsson;S. Gruber
- Proc. Internat. Conf. on Industrial Electronics Control, and Instrumentation(IECON) Vision system for on-line surface inspection in aluminum casting process C. Fernandez;C. Platero;P. Campoy;R. Aracil
- IEEE Trans. on System. Man and Cybernetics v.3 no.6 Textual features for image classification R. Haralick;K. Shanmugam;I. Dinstein
- Proceeding of the IEEE v.67 no.5 Statistical and structual approaches to textual R. M. Haralick
- Proc. Internat. Conf. on Image Processing v.3 Multiscale image texture analysis in wavelet spaces M. H. Gorβ;R. Koch;L .Lippert;A. Dreger
- Signal Processing v.11 Local Lineal transform for texture measurements M. Unser
- IEEE Trans. on Pattern Analysis and Machine Intelligence v.11 no.7 Multiresolution feature extraction and selection for texture segmentation M. Unser;M. Eden
- Proc. Computer Vision and pattern Reognition Texture discrimination using wavelets M. Unser
- IEEE Trans. on Image Processing v.4 no.11 Texture classification and segmentation using wavelet frames M. Unser
- SLAM J. Math v.15 Decomposition of hardy functions into square integravble wavelets of constant shape A. Grossmann;J. Morlet
- Digital Image Processing(Second edition) W. K. Pratt
- IEEE Trans. on Medical Imaging v.15 no.2 Wavelet trasforms for detecting microcalcifications in mammograms R. N. Strickland;H. I. Hahn
- IEEE Trans. on Information Theory v.37 no.4 Zero-crossings of a wavelet transform S. Mallat
- IEICE Trans. on Information and Systems v.E80-d no.5 Surface defect inspection of cold rolled strips with features based on adaptive wavelt packets C. S. Lee;C. H. Choi;J. Y. Choi;S. H. Choi
- Digital Image Processing Algorithms I. Pitas
- Digital Image Processing R. C. Gonzalez;R. E. Wood
- Introduction to Statistical Pattern Recognition Introduction to Statistical Pattern Recognition K. Fukunga