어레이 접지전압 조정에 의한 저전력, 고성능 내장형 SRAM 회로 기술

Low power-high performance embedded SRAM circuit techniques with enhanced array ground potential

  • 정경아 (단국대학교 전자공학과) ;
  • 손일헌 (단국대학교 전자공학과)
  • 발행 : 1998.02.01

초록

Low power circuit techniques have been developed to realize the highest possible performance of embedded SRAM at 1V power supply with$0.5\mu\textrm{m}$ single threshold CMOS technology in which the unbalance between NMOS and PMOS threshold voltages is utilized to optimize the low power CMOS IC design. To achieve the best trade-off between the transistor drivability and the subthreshold current increase, the ground potential of memory array is raised to suppressthe subthreshold current. The problems of lower cellstability and bit-line dealy increase due to the enhanced array ground potential are evaluated to be controlled within the allowable range by careful circuit design. 160MHz, 128kb embedded SRAM with 3.4ns access time is demonstrated with the power consumption of 14.8mW in active $21.4{mu}W$ in standby mode at 1V power supply.

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