A Study on the Small Disturbance Measurement of Liquid Film Thickness by $Moir\acute{e}$ Fringe

$Moir\acute{e}$ Fringe에 의한 액막 두께 미소 변위 측정 연구

  • 전홍신 (경희대학교 기계공학과) ;
  • 김경훈 (경희대학교 기계공학과)
  • Published : 1997.12.31

Abstract

Liquid film thickness is measured by $moir\acute{e}$ topography which monitored liquid surface. $Moir\acute{e}$ fringe measurement techniques share the inherent simplicity found in optical interferometric techniques have the advantage of use over a greater range of displacement. $Moir\acute{e}$ fringe are the geometric interference patterns observed when two dense line grating are superposed. Light transmitted through a fixed line grating is deviated by the liquid film surface, producing a distored image of the grating. The $moir\acute{e}$ fringe produced by projection of this optically distored grating onto a second stationary grating permit visualization of the liquid surface and measurement of the liquid film thickness. This study measured the small amplitude of liquid film thickness to the $moir\acute{e}$ fringe pattern produced when spherical metal was dropped glycerin put)1 And the measurement of liquid film thickness flowing down an inclined plate are required to calculate the liquid slope in a position.

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