The Journal of Korean Institute of Communications and Information Sciences (한국통신학회논문지)

The Korean Institute of Commucations and Information Sciences (한국통신학회)
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Design and implementation of improved march test algorithm for embedded meories

내장된 메모리를 위한 향상된 March 테스트 알고리듬의 설계 및 구현

  • 박강민 (숭실대학교 대학원 전자계산학과) ;
  • 장훈 (숭실대학교 컴퓨터학부) ;
  • 양승민 (숭실대학교 컴퓨터학부)
  • Published : 1997.07.01
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Abstract

In this work, an efficient test algorithm and BIST architeture a for embedded memories are presented. The proposed test algorithm can fully detect stuck-at fault, transition fault, coupling fault. Moreover, the proposed test algorithm can detect nighborhood pattern sensitive fault which could not be detected in previous march test algoarithms. The proposed test algorithm perposed test algorithm performs testing for neghborhood pattern sensitive fault using backgroung data which has been used word-oriented memory testing.

Keywords

References

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