참고문헌
- J. Appl. Phys. v.65 R.Takayama;Y.Tomita
- Jpn. J. Appl. Phys v.32 Y.Ohya;T.Tanaka;Y.Takahashi
- Proc. 12th Int. Cong. Electron Microscopy A.Riveros;G.Castellano
- Proc.9th Annual SEM Symposium H.Yakowitz;D.E.Newbury
- X-ray Spectrom v.10 H.Packwood;J.D.Brown
- Proc. 11th Int. Cong. on X-ray Optics and Microanalysis J.L.Pouchou;F.Pichoir
- Proc. 12th Int. Cong. on X-ray Optics and Microanalysis J.L.Pouchou;F.Pichoir;D.Bolvin
- Proc. 6th Int. Cong. on X-ray Optics and Microanalysis W.Reuter
- C.R. Acad. Sci. Paris v.268 F.Arnal;P.Verdier;P.D.Vincinsini
- Natl. Bur. Stand. Tech. Note K.F.J.Heinrich;D.E.Newbury;H.Yakowitz
- J. Phys. D: Appl. Phys. v.5 K.Kanaya;S.Okayama
- Kor. J. Mater Res. J.W.Kim;Y.I.Kim;D.M.Wee;W.J.Lee
- Jpn. J. Appl. Phys v.36 S.O.Chung;J.W.Kim;C.O.Park;W.J.Lee
- Jph. J. Appl. Phys v.32 T.Hase;T.Sakuma;Y.Miyasaka;K.Hirata;N.Hosokawa