References
- Proc. IEEE v.74 no.1 The measurement of the properties of materials M.N.Afsar;J.R.Birch;R.N.Clake
- IEEE Trans. Microwave Theory and Tech v.43 no.7 A novel analytic method for broad band determination of electromagnetic imoedances and material parameters R.Pelster
- HP Solution Note 4291-4 Permittivity Measurements of PC Board and Substrate Materials using the HP 4291A and HP 16453A
- IEEE Trans. Microwave Theory and Tech v.39 no.4 A generalized theory and neww calibration procedures for network analyzer self-calibration H.J.Eul;B.Schiek
- Microwave Theory and Tech v.35 no.7 Two methods for measurement of substrate dielectric constant Nirod K.Das;Susanne M. Voda and David M.Pozar
- Microwave Theory and applications(1st ed) S.F.Adam