Preparation and Characterization of Porous Low Reflective Coating Films for $SiO_2.ZrO_2$ System by Sol-Gel Dip-Coating Method

졸-겔 침지법에 의한 $SiO_2.ZrO_2$계 다공질 저반사 코팅막 제조 및 특성

  • 김상진 (강원대학교 재료공학과) ;
  • 한상목 (강원대학교 재료공학과) ;
  • 신대용 (강원대학교 재료공학과) ;
  • 김경남 (삼척산업대학교 재료공학과)
  • Published : 1997.07.01

Abstract

Porous low reflective coating films of SiO2.ZrO2 system were prepared from the mixed alkoxide solutions of Zr(O-nC3H7)4 and partially prehydrolyzed TEOS by the sol-gel method using the dip-coating technique. In the case of 90SiO2.10ZrO2 porous coating films with HCl and H2O content was 0.3 mole and 4 mole, 378 m2/g of the specific surface area, 0.254 cm3/g of total pore volume, 30-50$\AA$ of average pore diameter. The transmittance of 90SiO2.10ZrO2 porous coated films was 95.38% at the wavelength of 550 nm, compared with the parent glass, the transmittance was increased with 4.38%.

Keywords

References

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