Test sequence generation using MUIO and shortest paths

MUIO와 shortest path를 이용한 개선된 시험순서생성

This paper introduces an algorithm which uses MUIO and the shortest paths to minimize the length of test sequence. The length of test sequence is equal to the total number of the edges in a symmetric test graph $G^{*}$. Therefore, it is important to make a $G^{*}$ with the least number of the edges. This algorithm is based on the one proposed Shen[2]. It needs the complexity to make shortest paths but reduces the thest sequence by 1.0~9.8% over the Shen's algorithm. and this technique, directly, derives a symmetric test graph from an FMS.