참고문헌
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- 충남과학연구지 v.18 no.2 이변량 시스템의 단계적충격검사를 위한 최적실험계획 박회창;임대혁;최만석;이석훈
- 응용통계연구 v.2 no.2 계단식 충격 생명검사에 관한 연구 이석훈
- Proceedings of the Fourth Berkeley Symposium on Mathematical Statistics and Probability Stochastic Models for Carcinogens Armitage, P.;Doll, R.
- IEEE Transactions on Reliability v.40 no.5 Optimum Simple Step Stress Accelerated Life Tests with Competing Causes of Failure Bai, D.S.;Chun, Y.R.
- IEEE Transactions on Reliability v.38 Optimum Simple Step Stress Accelerated Life Tests with Censoring Bai, D.S.;Kim, M.S.;Lee, S.H.
- IAPQR Transactions Jour. Ind. Assoc. for Productivity, Quality and Reliability v.6 no.1 On the Performance of Least Squares Estimator in Type-Ⅱ censored aaccelerated Life Tests Bhattacharyya, G.K.;Soejoeti, Z.
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- Naval Research Logistics Quarterly v.31 Estimation for a Weibull Accelerated Life Testing Model Glaser, R.E.
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- IEEE Transaction on Reliability v.R-33 no.3 Reliability of Liquid Crystal Display Kitagawa, K.;Toriama, K.;Kanuma, Y.
- Communications in Statistics-Theory and Methods v.10 Accelerated Life Tests under Competing Weibull Causes of Failure Klein, J.P.;Basu, A.P.
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- Methods for Statistical Analysis of Reliability and Life Data Mann, N.R.;Schafe, R.E.;Singpurwalla,N.D.
- IEEE Transactions on Reliability v.32 Optimum Simple Step Stress Plans for Accelerated Life Testing Miller, R.;Nelson, W.B.
- General Electric Research & Development TIS Report 71-C-001 Statistical Methods for Accelerated Life Test Data- The Inverse Power Law Model Nelson, W.B.
- IEEE Transactions on Reliability v.29 Accelerated Life Testing-Step Stress Models and Data Analysis Nelson, W.B.
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- Technometrics v.15 Linear Estimation of a Regression Relationship from Censored Data - part 2. Best Linear Nelson, W.B.;Hahn, G.J.
- IEEE Transactions on Reliability v.R-24 Optimum Accelerated Life Tests for Normal and Lognormal Life Distributions Nelson, W.B.;Kielpinski, T.J.
- Technometrics v.18 Theory for Optimum Censored Accelerated Tests for Normal and Lognormal Life Distributions Nelson, W.B.;Kielpinski, T.J.
- Technometrics v.20 Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Nelson, W.B.;Meeker,W.Q.