Electrical & Electronic Materials (E2M - 전기 전자와 첨단 소재)
- Volume 9 Issue 5
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- Pages.506-511
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- 1996
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- 2982-6268(pISSN)
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- 2982-6306(eISSN)
A study on fast langmuir probe driving circuit for measurement of plasma parameter and its application
플라즈마 파라메타 측정용 고속 langmuir프로브 구동회로 실현 및 적용
Abstract
This paper deals with an inexpensive, simple and fast Langmuir probe sweeping circuit and its application. This sweeper completes a probe trace in a 1 ms order. Futhermore, the circuit drives a maximum probe voltage of
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