The Korean Journal of Ceramics

The Korean Ceramic Society (한국세라믹학회)
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Micorstructure and Microwave Dielectric Propertics of Ni-doped $(Zr_{0.8}Sn_{0.2})TiO_4$ Ceramics

  • Lee, Dal-Won (Department of Materials Science and Engineering, Korea University) ;
  • Sahn Nahm (Department of Materials Science and Engineering, Korea University) ;
  • Kim, Myong-Ho (Department of Materials Science and Engineering, Changwon National University) ;
  • Byun, Jae-Dong (Department of Materials Science and Engineering, Korea University)
  • Published : 1996.09.01
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Abstract

The effects of NiO addition on the microstructure and microwave dielectric properties of ($Zr_{08}Sn_{02}$)$TiO_4$ (ZST) were investigated. With the NiO addition, a higher density of ZST ceramics than 95% of the theoretical values has been obtained in the sintering temperature range of 1400 to 150$0^{\circ}C$. Energy dispersive X-ray spectrometry (EDS) analysis of sintered specimen shows the presence of second phase at grain boundaries, which is considered to be $NiTiO_3$. Dielectric constant of the specimen is found to increase linearly with density. Q-values and TC$_r$ decrease with increasing NiO content. The variation of dielectric properties with NiO content is discussed in terms of the second phase. The ZST ceramics with 0.25 wt% NiO showed ${\varepsilon}_{\gamma}$=38, Q=7000 at GHz and TC$\gamma$=-0.5 ppm/$^{\circ}C$, comparable with the values obtained by the previous investigations.

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References

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