The Step Stress Life Testing for the Parallel System with Censored Data

절단된 자료가 있는 병렬형 시스템의 단계적 충격수명검사

We consider a step-stress life testing which is devised for a two-component parallel system with considerably long life time. To describe such a system, we use an exponential distribution as the survival function. The lift distribution is assumed between the log mean life time and the stress with the cumulative exposure model. The criterion for optimality is to minimize the sum of the variances of the maximum likelihood estimators of the mean life times of each part under the normal stress.