Applied Microscopy
- Volume 25 Issue 2
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- Pages.65-72
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- 1995
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- 2287-5123(pISSN)
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- 2287-4445(eISSN)
HRTEM Observations on ZnSe/GaAs Interfaces Grown by MBE
MBE로 성장시킨 ZnSe/GaAs의 고분해능 TEM에 의한 계면관찰
- Lee, Hwack-Joo (Korea Research Inst. of Standards and Science) ;
- Ryu, Hyun (Korea Research Inst. of Standards and Science) ;
- Park, Hae-Sung (Samsung Advanced Inst. of Technology) ;
- Kim, Tae-il (Samsung Advanced Inst. of Technology)
- 이확주 (한국 표준과학연구원 미세조직연구그룹) ;
- 류현 (한국 표준과학연구원 미세조직연구그룹) ;
- 박해성 (삼성종합기술원 광반도체 연구실) ;
- 김태일 (삼성종합기술원 광반도체 연구실)
- Published : 1995.06.01
Abstract
The interfacial structures of ZnSe/GaAs which were grown by single chamber MBE at
Keywords