Bulletin of the Korean Chemical Society

Korean Chemical Society (대한화학회)
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Synthesis, Structural and Electrical Characterizations of $Pr_{2-x}Ba_xNiO_{4{\pm}\delta}{^\$}$

  • Published : 19950200
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Abstract

Solid solutions of Pr2-xBaxNiO4±δ with K2NiF4-type structure were prepared in air and characterized by powder X-ray diffraction, Rietveld refinements, iodometry titrations, and conductivity measurements. The range of the solid solution was 0 ≤ x < 0.5. The crystal structure changes from orthorhombic (Fmmm) for x ≤ 0.1 to pseudo-tetragonal (I4/mmm) for x ≥ 0.2. The orthorhombic structure of x=0.1 transforms to tetragonal at low temperature. The bond distances obtained from the Rietvel analyses did not vary significantly with the Ba content except that of Ni-O (parallel to the c-axis) which showed an abrupt increase from x=0.1 to 0.2. The excess oxygen content (δ) decreases from 0.241 to 0.03 with increasing substituted Ba contents within the solution range. The samples are all semiconductors at the temperature range 4 < T < 300 K.

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References

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