An Accurate and Matching-Free MOSFET's Threshold Voltage Extraction Using New Novel Circuit Thencique

새로운 회로기술을 이용한 고정밀 Matching-Free MOSFET 문턱전압 추출

An accurate threshold voltage extraction scheme for MOS transistors is presented. In contrast to alternative methods recently reported in the literature, this scheme does not need matched replica of the transistor under test, and thus can be applied more effectively and accurately to raal-time on-chip applications where threshold voltage measurements are required for many transistors with various geometries and bias conditions. The proposed scheme is accurately implemented in a matching-free way using a ratio-indepentent switched-capacitor subtracting amplifier and a dynamic current mirror. Nonideal effects associated with these circuits have been investiggated and compensated.