근본 출력에 근거한 고장 모의실험

A Fault Simulation Method Based on Primary Output

  • 이상설 (원광대학교 전기공학과) ;
  • 박규호 (한국과학기술원 전기 및 전자공학과)
  • 발행 : 1994.06.01

초록

In this paper, we propose a fault simulation method based on primary output in combinational circuit. In the deterministic test pattern generation, each test pattern is genterated incrementally. The test pattern is applied to the primary inputs of circuit under test to simulate faults. We detect the faults with respect to each primary output. The fault detection with resptect to each primary output is reflected by the corresponding bit in the detection words, and efficient fault detection for the reconvergent fan-out stem is achieved with dynamic fault propagation. As an experimental result of the fault simulation with our method for the several bench mark circuits, we illustrated the good performance showing that the number of gates to be activated is much reduced as compared with other method which is not based on primary output.

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