An Economic Life Test Sampling Plan for Repairable Products with Exponential Interfailure Time Distribution

In this article an economic life test sampling plan is considered for repairable products when the products in each lot have the same interfailure time distribution, but the mean time between failure (MTBF) of a lot varies from lot to lot according to a known prior distribution. A cost model is constructed which consists of test cost, accept cost, and reject cost. Determination of the optimal plan which minimizes the expected average cost per lot is discussed. Numerical examples are presented to illustrate the use of the proposed sampling plans and sensitivity analyses for parameters of the prior distribution are performed.