Analytical Science and Technology (분석과학)
- Volume 5 Issue 1
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- Pages.121-126
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- 1992
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- 1225-0163(pISSN)
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- 2288-8985(eISSN)
Transmission Electron Microscopy of GaAs Planar Defects
투과전자현미경을 이용한 GaAs의 면결함 구조 연구
- Cho, N.H. (Materials Research Division Korea Institute of Science and Technology) ;
- Hong, Kug Sun (Materials Research Division Korea Institute of Science and Technology) ;
- Cater, C.B. (Dept. of Materials Science and Engineering, Cornell University)
- Received : 1992.03.15
- Published : 1992.03.25
Abstract
Transmission electron microscopy was used to investigate the structure of GaAs
GaAs