반도체 물질 및 소자에 의한 1/f 잡음의 의존성

The Dependence of the 1/f Noise on the Semiconductor Materials and Devices

In this paper the relative magnitudes of the 1/f noise constants were experimentally investigated in the plana type's resistors fabricated with the different type's semicondector materials, and a new measurement technique for the 1/f noise in the semiconductor plana type's resistors may be located at the semiconductor and silicon dioxde.