The Journal of Korean Institute of Communications and Information Sciences (한국통신학회논문지)
- Volume 16 Issue 7
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- Pages.615-627
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- 1991
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- 1226-4717(pISSN)
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- 2287-3880(eISSN)
The Dependence of the 1/f Noise on the Semiconductor Materials and Devices
반도체 물질 및 소자에 의한 1/f 잡음의 의존성
Abstract
In this paper the relative magnitudes of the 1/f noise constants were experimentally investigated in the plana type's resistors fabricated with the different type's semicondector materials, and a new measurement technique for the 1/f noise in the semiconductor plana type's resistors may be located at the semiconductor and silicon dioxde.
Keywords