한국경영과학회지 (Journal of the Korean Operations Research and Management Science Society)

  • 제16권2호
  • /
  • Pages.148-158
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  • 1991
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  • 1225-1119(pISSN)
  • /
  • 2733-4759(eISSN)
한국경영과학회 (The Korean Operations Research and Management Science Society)
권호 표지

Performance Evaluation Involving Multiple Parameters in Built-In-Test Systems

  • Kang, Hee-Jung (Dept. of Industrial Engineering, Kon-Kuk University) ;
  • Yoo, Wang-Jin (Dept. of Industrial Engineering, Han Nam University)
  • 발행 : 1991.12.01
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초록

The Built-In-Test (BIT) system is an integrated subsystem for the determination of the health status of any primary system. The BIT consists of hardware and software installations directed at performance of the functions of fault detection, diagnosis and isolation, as well as primary system record failure information. Evaluation of the difinitions appropriate to the BIT system, including system characteristics and parameters, is important to an understanding of system functions. The object of this paper is to present general definitions of the BIT diagnosis parameters and a semiquantiative evaluation method for BIT systems. Finally, two case studies for actual problem solutions are included.

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참고문헌

  1. Annual R & M Symposium Built-In-Test Verification Techniques Albert,J.(et al.)
  2. Annual R & M Symposium Is BIT a Toy, Blessing or Annoyance Bozic,S.;Shaw,L.
  3. Annual R & M Symposium An Expert System to Facilitate Fault Isolation Buswell,S.M.;Sesto,P.A.
  4. Annual R & M Symposium Diagnostics Specification-A proposed Approach Carroll,W.H.(et al.)
  5. Annual R & M Symposium BIT Blueprint Toward More Effective Built-In-Test Daugherty,G.;Steinmetz,G.
  6. Annual R & M Symposium Analysis of Built-in Test Accuracy Gleason,D.
  7. Reliability Engineering v.15 no.4 Built in Test-Past Mistakes, Present Problem and Future Solutions Irwing,M.H.
  8. Proceeding of International Industrial Engineering Conference Built-In-Test Technology in Commercial Systems Lamberson,L.R.;Shao,J.
  9. IEEE Trans. v.R-30 Design & Evaluation Methodology for Built-In-Test Lord,D.H.;Gleason,D.
  10. MIL-STD-756B, MILITARY STANDARD Reliability Modeling and Prediction
  11. AIAA-83-2448 Avionics Built-In-Test Effectiveness and Life Cycle Cost Palazzo,C.J.;Gleason,D.
  12. Annual R & M Symposium An Approch to the Selection of Built -In-Test Devices Rosin,A.
  13. Reliability Engineering and System Safety v.23 Impact of BIT Design Parameters on Systems RAM Shao,J.;Lamberson,L.R.
  14. Proceedings of China-Japan International Symposium on Instrumentation, Measurement and Automatic Control Effect of Self-Test on the Reliability of an Automatic Control system Shao,J.;Yoo,W.