A Study on the Structural Analysis of Amorphous Silicondioxide Prepared Sol-Gel Method with XRD

X-선 회절을 이용한 비정질 SiO$_2$ Gel 의 구조 해석에 관한 연구

  • Yoon dai Hyun (Department of Chemistry, dyung Hee University) ;
  • Kim Ki Sun (Department of Chemistry, dyung Hee University) ;
  • Jung Hyun Chai (Department of Chemistry, Kyung Hee University)
  • Published : 19900900

Abstract

The structural variation process of amorphous SiO$_2$ gel upon heat-treatment conditions of 80, 250, 450 and 1000$^{\circ}C$ has been studied by using the radial distribution functions (RDF$_{obs}$) estimated from the X-ray diffraction intensities. The expected gel structure was determined by comparing the RDF$_{obs}$ with those for the other six standard samples selected appropriately. The structure of specimens prepared by sol-gel method is well consistent with that of fused SiO$_2$ (${\beta}$-cristobalite with cubic symmetry) except a slight difference in O-O band distance.

Sol-gel법을 통하여 만들어진 비정질 SiO$_2$ gel들의 구조가 열처리 온도, 80$^{\circ}C$, 250$^{\circ}C$, 450$^{\circ}C$ 그리고 1000$^{\circ}C$에 따라 변화하는 과정을 X-선 회절 강도 측정으로부터 구한 동경분포곡선을 이용하여 알아보았다. 그리고 이를 6개의 결정들과 비교하여 예상되는 구조를 밝혔다. 각 시편들은 용융법으로 구한 SiO$_2$의 구조와 O-O결합쌍을 제외하고는 가장 유사한 구조를 가지며 cubic형으로 나타났다.

Keywords

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