대한전자공학회논문지 (Journal of the Korean Institute of Telematics and Electronics)
- 제25권12호
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- Pages.1582-1585
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- 1988
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- 1016-135X(pISSN)
마이크로파에서 얇은 유전체의 유전상수 및 유전손실의 측정방법에 대한 연구
A Dielectric Measurement Technique of Thin Samples at Microwave Frequencies
초록
A cavity perturbation technique is employed to determine the dielectric property of thin samples. Substrates in microwave integrated circuits are fabricated in sheet form and are expected to have a dielectric constant less than 10 and a dielectric loss better than 10**-3. This research aimed to determine both dielectric constant and dielectric loss with good accuracy. The tecynique makes use of thin circular disk samples placed in a right circular cylindrical cavity. The accuracy of measurements is within \ulcorner% for dielectric constnat and 3x10**-4 for dielectric loss.
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