Journal of the Korean Institute of Telematics and Electronics (대한전자공학회논문지)
- Volume 25 Issue 12
- /
- Pages.1582-1585
- /
- 1988
- /
- 1016-135X(pISSN)
A Dielectric Measurement Technique of Thin Samples at Microwave Frequencies
마이크로파에서 얇은 유전체의 유전상수 및 유전손실의 측정방법에 대한 연구
Abstract
A cavity perturbation technique is employed to determine the dielectric property of thin samples. Substrates in microwave integrated circuits are fabricated in sheet form and are expected to have a dielectric constant less than 10 and a dielectric loss better than 10**-3. This research aimed to determine both dielectric constant and dielectric loss with good accuracy. The tecynique makes use of thin circular disk samples placed in a right circular cylindrical cavity. The accuracy of measurements is within \ulcorner% for dielectric constnat and 3x10**-4 for dielectric loss.
Keywords