E2M - 전기 전자와 첨단 소재 (Electrical & Electronic Materials)
- 제1권1호
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- Pages.62-69
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- 1988
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- 2982-6268(pISSN)
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- 2982-6306(eISSN)
Te-Se 칼코게나이드박막의 열화에 관한 연구
A study on the degradation of Te-Se chalcogenide thin films
초록
Te-thin films were highly proper material for optical recording media, but has the demerit of short archival life time due to the unstability to humidity. In order to restrain the degradation, Te
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