Electrical & Electronic Materials (E2M - 전기 전자와 첨단 소재)
- Volume 1 Issue 1
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- Pages.62-69
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- 1988
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- 2982-6268(pISSN)
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- 2982-6306(eISSN)
A study on the degradation of Te-Se chalcogenide thin films
Te-Se 칼코게나이드박막의 열화에 관한 연구
Abstract
Te-thin films were highly proper material for optical recording media, but has the demerit of short archival life time due to the unstability to humidity. In order to restrain the degradation, Te
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