A study on the degradation of Te-Se chalcogenide thin films

Te-Se 칼코게나이드박막의 열화에 관한 연구

  • 정홍배 (광운대학교 공과대학 전자재료공학과) ;
  • 이영종 (광운대학교 공과대학 전자재료공학과) ;
  • 김영호 (수원대학교 전자재료공학과) ;
  • 이중기 (한국전자통신연구소 광소자연구실) ;
  • 송준석 (금성전설연구소)
  • Published : 1988.01.01

Abstract

Te-thin films were highly proper material for optical recording media, but has the demerit of short archival life time due to the unstability to humidity. In order to restrain the degradation, Te$_{100-x}$Se$_{x}$ alloys adding Se stable for the humidity were fabricated. Primarily, to measure the degradation rate with varing the composition of Se to x=5, 10, 14, 25 at.% at Te$_{100-x}$ Se$_{x}$, the change of light transmittance was used in various temperature-humidity environments. As the results, it was showed that Se$_{86}$Te$_{14}$ thin was the most proper composition for the improvement of degradation restraint.int.int.

Keywords