The Journal of Korean Academy of Prosthodontics (대한치과보철학회지)
- Volume 25 Issue 1
- /
- Pages.7-16
- /
- 1987
- /
- 0301-2875(pISSN)
- /
- 2005-3789(eISSN)
SCANNING ELECTRON MICROSCOPIC STUDY ON THE TAG LENGTH OF RESIN IN THE ETCHED ENAMEL CEMENTED WITH THE COMPOSITE RESIN CEMENT
탈회된 법랑질과 복합레진계 시멘트의 접착시 레진돌기 길이에 관한 주사현미경적 연구
- Park, Chang-Keun (Department of Prosthodontics, College of Dentistry, Seoul National University) ;
- Chang, Wan-Shik (Department of Prosthodontics, College of Dentistry, Seoul National University) ;
- Yang, Jae-Ho (Department of Prosthodontics, College of Dentistry, Seoul National University) ;
- Lee, Sun-Hyung (Department of Prosthodontics, College of Dentistry, Seoul National University)
- Published : 1987.12.01
Abstract
The purpose of this study was to compare the resin tag length of 3 composite resin cements: Panavia, Compspan, Conclude, and the resin tag length of Panavia cemented to daliva-contaminated enamel using scanning electron microscopy. The following conclusions can be drawn from this study. 1. The resin tag length of panavia was
Keywords