Journal of the Korean Institute of Telematics and Electronics (대한전자공학회논문지)
- Volume 24 Issue 2
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- Pages.260-264
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- 1987
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- 1016-135X(pISSN)
The Effect of Junction Depth on the Charge Density in $n^+ -p$ junction with Consideration of Position dependent Dielectric Constant
$n^+ -p$ 접합에서 위치함수인 유전율을 고려한 경우 접합깊이가 전하밀도에 미치는 영향
- Kim, Choong Won (Dept. of Elec. Eng., Hanyang Univ.) ;
- Han, Baik Hyung (Dept. of Elec. Eng., Hanyang Univ.)
- 김충원 (한양대학교 전자공학과) ;
- 한백형 (한양대학교 전자공학과)
- Published : 1987.02.01
Abstract
We examine the effect of junction depth on the charge density solving numerically the general form of Poisson's equation for Gaussian
Gaussian
Keywords