대한전기학회논문지 (The Transactions of the Korean Institute of Electrical Engineers)
- 제32권6호
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- Pages.199-204
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- 1983
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- 0254-4172(pISSN)
Al/비정질 Se/Al구조에서의 암기력발생현상에 관한 연구
A Study on Dark EMF Phenomena in Al/Amorphous Se/Al Structure
초록
In this paper, we investigated that the Al-Amorphous Se-Al structure had a large photovoltage and a Dark EMF (DEMF). This DEMF phenomena did not show just after the fabrication of a sample. However, it was shown after a few days, and it was increased with time, and was saturated after 30 days. Just after the fabrication of a sample, by appling the positive voltage on a sample for 100mins, we observed almost the same effect as had shown in a aging experiment. As the results, we found that Al3+ ions has related to a DEMF by migrating into amorphous Se, and form a trap in amorphous Se. We have also observed the photocapacitance effect to identify this trap formation.
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