On the Graphitic Properties of Korean Anthracite (II) X-ray Diffraction Method as an Estimation of the Graphitic Properties of Anthracite

石炭의 黑鉛性에 關한 硏究 (第2報)

  • Published : 19630600

Abstract

In the previous paper of the series of researches on the graphitic properties of anthracites, authors have already reported the results on the electrical specific resistance measurements for Korean anthracites in order to develope a simple methods which differentiate graphite from anthracite. In this paper, the X-ray diffraction method and oxidation have been applied and compared with the results which were obtained by the specific resistance measurements in the previous paper. It has been confirmed that there is a parallel relation between the value of specific resistance measurement and height of hexagonal peak by X-ray diffraction, but the color reaction due to graphitic acid by oxidation does not show any definite critical points between graphite and anthracite.

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References

  1. Journal of the Korean Chemical Society v.5 吳信燮;李錫源
  2. A Comprehensive Treatise on Inorg. & Theo. Chem. v.5 J.W. Mellor
  3. 中央工業硏究所報告 v.9 吳信燮;崔昌松