Flaw Detection in LCD Manufacturing Using GAN-based Data Augmentation

Defect detection during liquid crystal display (LCD) manufacturing has always been a critical challenge. This study aims to address this issue by proposing a data augmentation method based on generative adversarial networks (GAN) to improve defect identification accuracy in LCD production. By leveraging synthetically generated image data from GAN, we effectively augment the original dataset to make it more representative and diverse. This data augmentation strategy enhances the model's generalization capability and robustness on real-world data. Compared to traditional data augmentation techniques, the synthetic data from GAN are more realistic, diverse and broadly distributed. Experimental results demonstrate that training models with GAN-generated data combined with the original dataset significantly improves the detection accuracy of critical defects in LCD manufacturing, compared to using the original dataset alone. This study provides an effective data augmentation approach for intelligent quality control in LCD production.