한국진공학회:학술대회논문집 (Proceedings of the Korean Vacuum Society Conference)
- 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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- Pages.170.1-170.1
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- 2016
Identification of native defects on the Te- and Bi-doped Bi2Te3 surface
- Dugerjav, Otgonbayar (Nano-Metrology Center, Division of Industrial Metrology, Korea Research Institute of Standards and Science) ;
- Duvjir, Ganbat (Nano-Metrology Center, Division of Industrial Metrology, Korea Research Institute of Standards and Science) ;
- Kim, Jinsu (Physics Department, Sogang University) ;
- Lee, Hyun-Seong (Physics Department, Sogang University) ;
- Park, Minkyu (Department of Nano Science, University of Science and Technology) ;
- Kim, Yong-Sung (Department of Nano Science, University of Science and Technology) ;
- Jung, Myung-Wha (Physics Department, Sogang University) ;
- Phark, Soo-hyon (Department of Physics and Graphene Research Institute, Sejong University) ;
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Hwang, Chanyong
(Nano-Metrology Center, Division of Industrial Metrology, Korea Research Institute of Standards and Science)
- 발행 : 2016.02.17
초록
키워드