Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 2016.02a
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- Pages.170.1-170.1
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- 2016
Identification of native defects on the Te- and Bi-doped Bi2Te3 surface
- Dugerjav, Otgonbayar (Nano-Metrology Center, Division of Industrial Metrology, Korea Research Institute of Standards and Science) ;
- Duvjir, Ganbat (Nano-Metrology Center, Division of Industrial Metrology, Korea Research Institute of Standards and Science) ;
- Kim, Jinsu (Physics Department, Sogang University) ;
- Lee, Hyun-Seong (Physics Department, Sogang University) ;
- Park, Minkyu (Department of Nano Science, University of Science and Technology) ;
- Kim, Yong-Sung (Department of Nano Science, University of Science and Technology) ;
- Jung, Myung-Wha (Physics Department, Sogang University) ;
- Phark, Soo-hyon (Department of Physics and Graphene Research Institute, Sejong University) ;
- Hwang, Chanyong (Nano-Metrology Center, Division of Industrial Metrology, Korea Research Institute of Standards and Science)
- Published : 2016.02.17
Abstract
Keywords
- Topological insulators;
- surface structure;
- defects;
- electronic properties;
- scanning tunneling microscopy