한국표면공학회:학술대회논문집 (Proceedings of the Korean Institute of Surface Engineering Conference)
- 한국표면공학회 2015년도 춘계학술대회 논문집
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- Pages.143-144
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- 2015
Investigation of Ar ion-milling rates for ultrathin single crystals
- 발행 : 2015.05.07
초록
Here we report the Ar-ion milling rates of ultrathin Si and GaAs single crystals. The thickness change is measured using convergent beam electron diffraction (CBED) technique with the help of Bloch wave simulation method. This study suggests the experimental procedures to determine the references for an etching rate to reduce a sample thickness or to remove the damaged sample surface using Ar-ion source.
키워드