Enhanced Infrared detection of photodetector using Ag nanowire-embedded ITO Layers

  • Kim, Hong-Sik (Photoelectric and Energy Device Application Lab & Department of Electrical Engineering, Incheon National University) ;
  • Kim, Jun-Dong (Photoelectric and Energy Device Application Lab & Department of Electrical Engineering, Incheon National University) ;
  • Patel, Malkeshkumar (Photoelectric and Energy Device Application Lab & Department of Electrical Engineering, Incheon National University) ;
  • Kim, Ja-Yeon (Korea Photonics Technology Institute (KOPTI)) ;
  • Gwon, Min-Gi (Department of Photonic engineering, Chosun university)
  • Published : 2015.08.24

Abstract

The Ag Nanowire is one of the materials that are widely studied as alternatives to ITO and is available for large area, low cost process and the flexible transparent electrode. However, Ag nanowire can have the problem of a lack of stability at high temperatures, making this impossible to form a film. Using a structure of ITO/AgNW/ITO in photodetector device, we improved the properties of the ITO in the IR region and improved the thermal stability of the AgNW. The structure of ITO/AgNW/ITO has a high transmittance value of 89% at a wavelength of 900 nm and provide a good electrical property. The AgNWs embedded ITO film has a high transmittance, this is because of the light scattering from the AgNW. The thermal stability of the developed ITO/AgNWs/ITO films were investigated and found AgNWs embedded ITO films posses considerable high stability compared to the solo AgNWs on the Si surface. The ITO/AgNWs/ITO device showed a improved photo-response ratio compared to those of the conventional TC device in IR region. This is attributed to the high transmittance and low sheet resistance. We suggest an effective design scheme for IR-sensitive photodetection by using an AgNW embedded ITO.

Keywords