PC1D 시뮬레이션을 이용한 결정질 실리콘 태양전지의 도핑 프로파일 모델링

The Doping Profile Modeling of Crystalline Silicon Solar Cell with PC1D simulation

  • 최성진 (한국에너지기술연구원 태양광센터) ;
  • 유권종 (한국에너지기술연구원 태양광센터) ;
  • 송희은 (한국에너지기술연구원 태양광센터)
  • Choi, Sung-Jin (Photovoltaic Research Center, Korea Institute of Energy Research) ;
  • Yu, Gwon-Jong (Photovoltaic Research Center, Korea Institute of Energy Research) ;
  • Song, Hee-Eun (Photovoltaic Research Center, Korea Institute of Energy Research)
  • 발행 : 2011.11.24

초록

The PC1D is widely used for modeling the properties of crystalline silicon solar cell. Optimized doping profile in crystalline silicon solar cell fabrication is necessary to obtain high conversion efficiency. Doping profile in the forms of a uniform, gaussian, exponential and erfc function can be simulated using the PC1D program. In this paper, the doping profiles including junction depth, dopant concentration on surface and the form of doping profile (gaussian, gaussian+erfc function) were changed to study its effect on electrical properties of solar cell. As decreasing junction depth and doping concentration on surface, electrical properties of solar cell were improved. The characteristics for the solar cells with doping profile using the combination of gaussian and erfc function showed better open-circuit voltage, short-circuit current and conversion efficiency.

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