Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 2010.02a
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- Pages.381-381
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- 2010
Band alignment and optical properties of $(ZrO_2)_{0.66}(HfO_2)_{0.34}$ gate dielectrics thin films on p-Si (100)
- Tahir, D. (Department of Physics, Chungbuk National University) ;
- Kim, K.R. (Department of Physics, Chungbuk National University) ;
- Son, L.S. (Department of Physics, Chungbuk National University) ;
- Choi, E.H. (Department of Physics, Chungbuk National University) ;
- Oh, S.K. (Department of Physics, Chungbuk National University) ;
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Kang, H.J.
(Department of Physics, Chungbuk National University) ;
- Heo, S. (Analytical Engineering Center, Samsung Advanced Institute of Technology) ;
- Chung, J.G. (Analytical Engineering Center, Samsung Advanced Institute of Technology) ;
- Lee, J.C. (Analytical Engineering Center, Samsung Advanced Institute of Technology)
- Published : 2010.02.17
Abstract