Proceedings of the Korean Magnestics Society Conference (한국자기학회:학술대회 개요집)
- 2009.12a
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- Pages.204-205
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- 2009
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- 2233-9485(pISSN)
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- 2233-9574(eISSN)
In-situ Synchrotron X-ray Diffraction Measurement of Epitaxial FeRh thin Films
- Jang, Sung-Uk (Laboratory for Photosynthetic Materials and Devices, Department of Materials Science and Engineering, Pohang University of Science and Technology) ;
- Hyun, Seung-Min (Division of Nano-Mechanical Systems Research, Korea Institute of Machinery & Materials) ;
- Lee, Hwan-Soo (eMD Center, Samsung Electro-Mechanics Co., Ltd.) ;
- Kwon, Soon-Ju (Laboratory for Photosynthetic Materials and Devices, Department of Materials Science and Engineering, Pohang University of Science and Technology) ;
- Kim, Ji-Hong (Laboratory for Photosynthetic Materials and Devices, Department of Materials Science and Engineering, Pohang University of Science and Technology) ;
- Park, Ki-Hoon (Laboratory for Photosynthetic Materials and Devices, Department of Materials Science and Engineering, Pohang University of Science and Technology) ;
- Lee, Hak-Joo (Division of Nano-Mechanical Systems Research, Korea Institute of Machinery & Materials)
- Published : 2009.12.06
Abstract
The magnetic properties and structure of FeRh thin film pitaxially grown onto MgO(001) substrate were studied by MPMS(Magnetic Properties Measure System) and in-situ temperature synchrotron XRD(X-ray Diffraction). The transition temperature of FeRh thin films was around 380K. Both M-T curve and d-spacing changes correspond to each other very closely.
Keywords