Proceedings of the Safety Management and Science Conference (대한안전경영과학회:학술대회논문집)
- 2009.04a
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- Pages.523-529
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- 2009
A Study on OLED display device's line defect test methode
OLED display device의 Line Defect 시험법에 관한 연구
Abstract
The ACF(Anisotropic Conductive Film) is used for bonding Drive IC and OLED display device panel. If ACF bonding process is problem, a malfunction of line defect can occur. Because electric resistance increase between the panel and drive IC after a period of time, drive IC can not supply enough current to the panel. This paper is studied on a method of test for line defect.