Characterization of Sub-Micrometer Patterned Nb Thin Film for Superconducting Electronics on Ultra-Sensitive Mechanical Device

  • Kim, Y.W. (Korea Research Institute of Standards and Science) ;
  • Lee, S.G. (Korea University) ;
  • Choi, J.H. (Korea Research Institute of Standards and Science)
  • Published : 2009.07.08