Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2009.11a
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- Pages.255-255
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- 2009
ZnO와 Al 나노 입자를 이용한 나노플로팅 게이트 메모리 특성
- Published : 2009.11.12
Abstract
In this work, nonvolatile nano-floating gate memory devices were fabricated with ZnO films and Al nanoparticles using the sputtering method on a glass substrate. Al nanoparticles acted as floating gate nodes in the devices. The fabricated device exhibits a threshold voltage shift of 1.7 V.