한국정보디스플레이학회:학술대회논문집
- 2009.10a
- /
- Pages.1383-1385
- /
- 2009
LCD Cell Aging Tester
- Son, Hyuk (Test Engineering 3Part, LCD Division, SAMSUNG ELECTRONICS CO., LTD.) ;
- Baek, Sung-Sik ;
- Oh, Hyeong-Geun (AoneMecha CO., LTD.) ;
-
Choi, Byoung-Deog
(School of Information and Communication Engineering, SungKyunKwan University, Semiconductor/Display Laboratory)
- Published : 2009.10.12
Abstract
This paper suggests that testing method and equipment structure to detect potential failures of LCD cells. LCD Cell Aging Tester is the unique process to detect failures related with ASG circuits. This system consists of four components that is Aging chamber, work table, probe contact unit, and pattern generator. The key factor of the concept is temperature aging and HVS driving. Complicated combination of test parameters including voltage, temperature and frequency provided practical burn-in conditions eligible for prediction of mass production.
Keywords
- SOG(System on a Glass);
- ASG(Amorphous Silicon GATE) Aging;
- HVS(High Voltage Stress);
- Probe contact unit