대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)
- 대한전자공학회 2008년도 하계종합학술대회
- /
- Pages.907-908
- /
- 2008
영상 초점을 이용한 물체의 표면 굴곡도 측정
Finding Surface Roughness of Materials using Image Focus
- Shim, Seong-O (Gwangju Institute of Science and Technology) ;
- Malik, Aamir Saeed (Gwangju Institute of Science and Technology) ;
- Choi, Tae-Sun (Gwangju Institute of Science and Technology)
- 발행 : 2008.06.18
초록
Estimation of surface roughness is an important quality measure for many applications including optics, polymers, semiconductor etc. In this paper, we propose to estimate surface roughness using image focus. We use polymers as test objects. The proposed method is an inexpensive and fast method based on Shape From Focus (SFF). We show that the results from SFF are encouraging for comparison of polymers using surface roughness.
키워드