Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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A Neural Network Modulars for Real-time Detection of Bad Materials

불량소자의 검지를 위한 실시간 전송 뉴로 모률라

  • 김종만 (전남도립대학 컴퓨터응용전기과) ;
  • 김원섭 (전남도립대학 컴퓨터응용전기과)
  • Published : 2008.04.17
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Abstract

A new modular Lateral Information Propagation Networks can be implemented in a IC chip with the circuit VLSI technology for detection of bad materials. The proposed modular architecture is propagated the neural network through inter module connections. For such inter module connections, the host(computer or logic) mediates the exchange of information among modules. Also border nodes in each module have capacitors for temporarily retaining the information from outer modules. For detecting of Faulty Insulator, $4\;{\times}\;4$ neural network modules has been designed and simulation of interpolation with the designed networks has been done.

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