Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2008.06a
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- Pages.311-312
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- 2008
Failure Mechanism of $RuO_2$ Thick Film Power Resistor
$RuO_2$ 후막 전력 저항기의 고장 메커니즘
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Choi, Sung-Soon
(Korea Electronics Technology Institute) ;
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Lee, Kwan-Hoon
(Korea Electronics Technology Institute)
- Published : 2008.06.19
Abstract