Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2008.06a
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- Pages.297-297
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- 2008
Growth and characterization of oxide buffer layer on IBAD_MgO template for HTS coated conductors
박막형 고온초전도 선재를 위한 산화물 완충층의 IBAD_MgO 기판에서의 성장과 특성
- Ko, Rock-Kil (Korea Electrotechnology Resarch Institute) ;
- Jang, Se-Hoon (Changwon National Univ.) ;
- Ha, Hong-Soo (Korea Electrotechnology Resarch Institute) ;
- Kim, Ho-Sup (Korea Electrotechnology Resarch Institute) ;
- Song, Kyu-Jeong (Korea Electrotechnology Resarch Institute) ;
- Ha, Dong-Woo (Korea Electrotechnology Resarch Institute) ;
- Oh, Sang-Soo (Korea Electrotechnology Resarch Institute) ;
- Park, Chan (Seoul National Univ.) ;
- Moon, Seung-Hyun (SuNAM) ;
- Kim, Young-Cheol (Pusan National Univ.)
- 고락길 (한국전기연구원) ;
- 장세훈 (창원대학교) ;
- 하홍수 (한국전기연구원) ;
- 김호섭 (한국전기연구원) ;
- 송규정 (한국전기연구원) ;
- 하동우 (한국전기연구원) ;
- 오상수 (한국전기연구원) ;
- 박찬 (서울대학교) ;
- 문승현 ((주)서남) ;
- 김영철 (부산대학교)
- Published : 2008.06.19
Abstract
Buffer layers play an important role in the development of high critical current density coated conductor.